40 CFR Part 469 — Electrical and Electronic Components Point Source Category
Subpart A — Semiconductor Subcategory
- § 469.10— Applicability.
- § 469.11— Compliance dates.
- § 469.12— Specialized definitions.
- § 469.13— Monitoring.
- § 469.14— Effluent limitations representing the degree of effluent reduction attainable by the application of the best practicable control technology currently available (BPT).
- § 469.15— Effluent limitations representing the degree of effluent reduction attainable by the application of the best available technology economically achievable (BAT).
- § 469.16— Pretreatment standards for existing sources (PSES).
- § 469.17— New source performance standards (NSPS).
- § 469.18— Pretreatment standards for new sources (PSNS).
- § 469.19— Effluent limitations representing the degree of effluent reduction attainable by the application of the best conventional pollution control technology (BCT).
Subpart B — Electronic Crystals Subcategory
- § 469.20— Applicability.
- § 469.21— Compliance dates.
- § 469.22— Specialized definitions.
- § 469.23— Monitoring.
- § 469.24— Effluent limitations representing the degree of effluent reduction attainable by the application of the best practicable control technology currently available (BPT).
- § 469.25— Effluent limitations representing the degree of effluent reduction attainable by the application of the best available technology economically achievable (BAT).
- § 469.26— Pretreatment standards for existing sources (PSES).
- § 469.27— New source performance standards (NSPS).
- § 469.28— Pretreatment standards for new sources (PSNS).
- § 469.29— Effluent limitations representing the degree of effluent reduction attainable by the application of the best conventional pollution control technology (BCT).